Products info.
전계방사전자주사현미경
- FE-Source : In-lens schottky FEG
- mage resolution : 1.5nm@30kV , 4.0nm@1.0kV
3.0nm@15kV, Probe current 1nA
- Observation mode : High Vacuum & Low Vacuum
- Image type
- HV mode : SE image & BSE image
- LV mode : BSE image
- Guide mode : OM image (Auto mode change between SEM image)
- Accelerating voltage : Max. 30kV
- Probe current : Max. 20nA
- LV pressure : 10 to 150pa
- OL Aperture : Multi hole exchange type
- mage resolution : 1.5nm@30kV , 4.0nm@1.0kV
3.0nm@15kV, Probe current 1nA
- Observation mode : High Vacuum & Low Vacuum
- Image type
- HV mode : SE image & BSE image
- LV mode : BSE image
- Guide mode : OM image (Auto mode change between SEM image)
- Accelerating voltage : Max. 30kV
- Probe current : Max. 20nA
- LV pressure : 10 to 150pa
- OL Aperture : Multi hole exchange type
핵자기공명분광 (400 MHz)
- Magnet system
- Self-shield superconducting magnet system in a standard dewar configuration (operation field at 9.4 Tesla) with bore diameter of 54 mm
- Less than 4 Hz/hr magnet field drift rate with maximum 365 days liquid helium hold time and 15 days liquid nitrogen hold time
- Magnet stray field (5 gauss) distance: 0.5 m / 1 m
- Shim / Lock System
- High accuracy digital control of r.f. generation, lock, and shim
- Self-shield superconducting magnet system in a standard dewar configuration (operation field at 9.4 Tesla) with bore diameter of 54 mm
- Less than 4 Hz/hr magnet field drift rate with maximum 365 days liquid helium hold time and 15 days liquid nitrogen hold time
- Magnet stray field (5 gauss) distance: 0.5 m / 1 m
- Shim / Lock System
- High accuracy digital control of r.f. generation, lock, and shim
탐침형 원자 현미경
(1) Scanning Probe Microscopy to measure surface characteristics such as Topography, Electrical, Magnetic properties and Scanning Thermal Microscopy(SThM)
(2) Direct Force Control Imaging (50pN or less) providing high resolution and non-destructive imaging
(3) Vertical resolution : 0.01nm or less
(4) Lateral resolution : 0.1nm or less
(5) Data pixel : Mode than 5012 x 5012 for 8 channels. or more
(6) SThM Temperature resolution : Less than 0.1℃ , depending on probe type
(2) Direct Force Control Imaging (50pN or less) providing high resolution and non-destructive imaging
(3) Vertical resolution : 0.01nm or less
(4) Lateral resolution : 0.1nm or less
(5) Data pixel : Mode than 5012 x 5012 for 8 channels. or more
(6) SThM Temperature resolution : Less than 0.1℃ , depending on probe type
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